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National Instruments
Keysight
VTKS


$34,000.00
Analog Input Coupling: DC
Dynamic RAM (DRAM): 4 GB
Maximum Sample Rate: 6.4 GS/s
Analog Input Resolution: 12 bits
Number of Voltage Input Channels: 2
Our courier will deliver to the specified address
2-3 Days
Free
DHL courier will deliver to the specified address
2-3 Days
Free
付款方式:
The PXIe-5774 provides up to 3 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PXIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset. The PXIe-5774 is ideal for time-domain measurements in areas such as scientific instrumentation, medical imaging, and particle physics. The FlexRIO driver includes support for finite acquisition, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA.
The PXIe-5774 FlexRIO Adapter Module is a high-speed analog input adapter module designed for use with FlexRIO FPGA modules in PXI Express systems. It delivers high-bandwidth signal acquisition combined with FPGA-based real-time processing, making it ideal for applications requiring ultra-fast data capture and customized signal analysis.
1. High-Speed Signal Acquisition
PXIe-5774 is used to capture high-frequency analog signals with high bandwidth, enabling precise analysis of fast transient and dynamic waveforms.
2. RF & Communication System Testing
Widely applied in RF and communication systems for capturing baseband and intermediate frequency (IF) signals, supporting modulation analysis and signal integrity testing.
3. FPGA-Based Real-Time Processing
When paired with FlexRIO FPGA modules, it enables custom real-time operations such as filtering, triggering, and data reduction.
4. Radar & Electronic Systems
Used in radar, electronic warfare, and advanced electronic systems for high-speed signal acquisition and processing.
5. Scientific Research & Advanced Measurement
Utilized in laboratories and research environments for high-speed data acquisition, experimental analysis, and precision measurements.
6. Automated Test Equipment (ATE)
Integrated into high-performance test systems for capturing and analyzing high-speed signals during validation and production testing.
7. High-Speed System Prototyping
Supports development and validation of next-generation high-speed data acquisition and FPGA-based processing systems.
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