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National Instruments
Keysight
VTKS


$11,385.00
Current Sensitivity: 100 fA
Includes Auxiliary Power: –
Number of SMU Channels: 1
Voltage Range: -200 V to 200 V
SourceAdapt: Yes
DC Current Range: -1 A to 1 A
Pulsed Current Range: -3 A to 3 A
Bus Connector: PXI Express
Our courier will deliver to the specified address
2-3 Days
Free
DHL courier will deliver to the specified address
2-3 Days
Free
付款方式:
The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 480 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
The PXIe-4137 Precision System SMU is a PXI Express high-channel-density source measure unit (SMU) designed for precision voltage/current sourcing and measurement in scalable automated test systems. It offers low noise, high accuracy, and parallel test capability, making it suitable for semiconductor testing and high-throughput production environments.
1. High-Density Parallel SMU Testing
PXIe-4137 supports multiple SMU channels, enabling simultaneous testing of multiple devices or multiple nodes within a device, improving efficiency.
2. Semiconductor Parametric Testing
Widely used for testing ICs, wafers, and components by measuring I-V characteristics, leakage currents, and electrical parameters.
3. Automated Test Equipment (ATE)
Integrated into large-scale ATE systems for synchronized multi-channel testing and high-volume production validation.
4. Low-Level Precision Measurement
Capable of measuring very small currents and voltages, suitable for sensitive electronic components.
5. Multi-Rail Power Testing & Control
Supports coordinated control and sequencing of multiple power rails in complex electronic systems.
6. Research & Development Applications
Used in laboratories for device characterization, circuit validation, and precision measurement.
7. Production & Quality Testing
Applied in manufacturing environments for repeatable and high-efficiency testing of electronic products.
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