USB-7845

The USB‑7845 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7845 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

Applications and Use Cases of USB-7845

The USB-7845 R Series FPGA Device is an FPGA-based multifunction device designed for high-speed data acquisition, real-time processing, and custom control applications. With onboard FPGA technology, it enables user-defined timing, triggering, and signal processing, making it ideal for applications that require low latency and deterministic performance.

1. Real-Time Signal Processing
USB-7845 uses onboard FPGA to perform real-time data processing such as filtering, triggering, and signal conditioning with minimal latency.

2. Custom Measurement & Control Systems
Engineers can develop customized measurement and control solutions by programming the FPGA for specific application requirements.

3. High-Speed Data Acquisition
It captures fast analog and digital signals with precise timing, suitable for dynamic and high-speed systems.

4. Hardware-in-the-Loop (HIL) Simulation
USB-7845 is widely used in HIL systems to provide deterministic real-time control and signal interaction.

5. Industrial Automation & Control
The device supports real-time control of industrial equipment, enabling high-speed decision-making and process control.

6. Research & Advanced Prototyping
Used in R&D for developing FPGA-based systems, testing algorithms, and building advanced prototypes.

7. Automated Test Equipment (ATE)
Integrated into automated test systems for high-speed data acquisition, custom signal generation, and device validation.