{"id":29004,"date":"2025-09-16T13:15:25","date_gmt":"2025-09-16T05:15:25","guid":{"rendered":"https:\/\/essenceinstrument.com\/?post_type=product&#038;p=29004"},"modified":"2026-04-13T09:31:06","modified_gmt":"2026-04-13T01:31:06","slug":"pxie-6570","status":"publish","type":"product","link":"https:\/\/essenceinstrument.com\/ru\/product\/pxie-6570","title":{"rendered":"PXIe-6570"},"content":{"rendered":"<p>The PXIe\u20116570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe\u20116570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.<\/p>\n<p>Part Number(s): 785283-01<\/p>\n<h3 data-section-id=\"3k52jr\" data-start=\"0\" data-end=\"46\"><span role=\"text\"><strong data-start=\"3\" data-end=\"46\">Applications and Use Cases of PXIe-6570<\/strong><\/span><\/h3>\n<p data-start=\"48\" data-end=\"417\">The PXIe-6570 Digital Pattern Instrument is a high-speed digital pattern instrument for PXI Express systems, designed for <strong data-start=\"170\" data-end=\"248\">functional test, validation, and high-speed digital interface verification<\/strong>. It provides <strong data-start=\"262\" data-end=\"341\">precise digital pattern generation and capture with accurate timing control<\/strong>, making it suitable for semiconductor and electronics testing environments.<\/p>\n<p data-start=\"445\" data-end=\"655\"><strong data-start=\"445\" data-end=\"484\">1. Semiconductor Functional Testing<\/strong><br data-start=\"484\" data-end=\"487\" \/>PXIe-6570 is widely used for testing digital ICs, ASICs, FPGAs, and memory devices by generating and capturing digital patterns to verify functionality and performance.<\/p>\n<p data-start=\"657\" data-end=\"867\"><strong data-start=\"657\" data-end=\"703\">2. High-Speed Digital Interface Validation<\/strong><br data-start=\"703\" data-end=\"706\" \/>It is suitable for validating digital interfaces such as LVDS, CMOS, and other high-speed communication protocols, ensuring timing accuracy and signal integrity.<\/p>\n<p data-start=\"869\" data-end=\"1039\"><strong data-start=\"869\" data-end=\"914\">3. Digital Pattern Generation and Capture<\/strong><br data-start=\"914\" data-end=\"917\" \/>The module can generate complex digital test patterns and capture DUT responses, enabling detailed analysis and debugging.<\/p>\n<p data-start=\"1041\" data-end=\"1184\"><strong data-start=\"1041\" data-end=\"1078\">4. Automated Test Equipment (ATE)<\/strong><br data-start=\"1078\" data-end=\"1081\" \/>PXIe-6570 is commonly used in ATE systems for high-throughput production testing of electronic devices.<\/p>\n<p data-start=\"1186\" data-end=\"1352\"><strong data-start=\"1186\" data-end=\"1227\">5. Embedded System and PCB Validation<\/strong><br data-start=\"1227\" data-end=\"1230\" \/>It is used for testing embedded systems, digital subsystems, and printed circuit boards during development and production.<\/p>\n<p data-start=\"1354\" data-end=\"1489\"><strong data-start=\"1354\" data-end=\"1398\">6. Hardware-in-the-Loop (HIL) Simulation<\/strong><br data-start=\"1398\" data-end=\"1401\" \/>The module can simulate digital environments and validate system responses in real time.<\/p>\n<p data-start=\"1491\" data-end=\"1665\"><strong data-start=\"1491\" data-end=\"1549\">7. Research, Development, and Digital System Debugging<\/strong><br data-start=\"1549\" data-end=\"1552\" \/>PXIe-6570 is widely used in R&amp;D labs for digital system validation, debugging, and advanced testing applications.<\/p>","protected":false},"excerpt":{"rendered":"<p>Maximum Active Load: 24 mA<br \/>\nModule Width: 2<br \/>\nNumber of Bidirectional Digital Channels: 32<\/p>","protected":false},"featured_media":31815,"template":"","meta":{"_acf_changed":false},"product_brand":[18],"product_cat":[667],"product_tag":[],"class_list":{"0":"post-29004","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_brand-national-instruments","7":"product_cat-pxi-modules","9":"first","10":"instock","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v25.0 (Yoast SEO v27.3) - https:\/\/yoast.com\/product\/yoast-seo-premium-wordpress\/ -->\n<title>NI PXIe-6570, PXI Digital Pattern Instrument, 785283-01 - Special Price Available<\/title>\n<meta name=\"description\" content=\"The PXIe\u20116570 is designed for semiconductor characterization and production test. 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