PXIe-4139

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$11,385.00

Item details

Current Sensitivity: 100 fA
Includes Auxiliary Power: –
Number of SMU Channels: 1
Voltage Range: -60 V to 60 V
SourceAdapt: Yes
DC Current Range: -3 A to 3 A
Pulsed Current Range: -10 A to 10 A
Bus Connector: PXI Express

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NI PXIe-4139 PXI Source Measure Unit

PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit

The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 40 W of DC power. This module features analog-to-digital converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.

Applications and Use Cases of PXIe-4139

The PXIe-4139 Precision System SMU is a PXI Express high-precision system source measure unit (SMU) designed for accurate voltage/current sourcing and measurement in automated and high-channel-count test environments. It offers high resolution, low noise, and excellent channel density, making it ideal for semiconductor parametric testing and scalable ATE systems.

1. High-Channel-Density SMU Testing
PXIe-4139 is optimized for systems requiring many SMU channels, enabling parallel testing of multiple DUTs to increase throughput.

2. Semiconductor Parametric Testing
Widely used for testing ICs, wafers, and semiconductor devices by measuring I-V characteristics, leakage current, and threshold parameters.

3. Automated Test Equipment (ATE)
Integrated into large-scale ATE systems for high-volume production testing with synchronized multi-channel operation.

4. Low-Level Precision Measurement
Capable of measuring very small currents and voltages with high accuracy, suitable for sensitive electronic components.

5. Multi-Rail Power Testing & Control
Supports testing of devices with multiple power domains, enabling precise sequencing and control.

6. Research & Advanced Development
Used in labs for device characterization, circuit validation, and precision experimentation.

7. Production & Quality Assurance
Applied in manufacturing environments for consistent, repeatable, and high-speed testing.

Part Number(s): 782856-02 | 782856-03

Specification

Overview

Brand

National Instruments

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