PXIe-1085

The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.

Part Number(s): 783588-01

Key Applications

1. Large-Scale Automated Test Systems (ATE)
PXIe-1085 is widely used in large automated test systems for mass production environments, such as electronics manufacturing and automotive testing. Its 18-slot architecture allows integration of multiple instruments for parallel testing, significantly increasing throughput.

2. High-Channel-Count Data Acquisition
It is ideal for applications requiring a large number of synchronized measurement channels, such as structural health monitoring, power grid analysis, and large industrial systems. The chassis ensures precise timing across all modules.

3. RF and Wireless Communication Testing
PXIe-1085 supports complex RF test systems, including multi-channel signal generation and analysis for technologies like 5G, MIMO, and advanced wireless communication validation.

4. Aerospace and Defense Systems
In aerospace and defense, PXIe-1085 is used for hardware-in-the-loop (HIL) simulation, radar testing, avionics validation, and electronic warfare system testing, where deterministic timing and scalability are essential.

5. Semiconductor Testing and Validation
The chassis is suitable for semiconductor production and R&D, supporting high-density testing, device characterization, and parallel validation of integrated circuits.

6. Advanced Research and Development (R&D)
PXIe-1085 is commonly deployed in research labs and engineering centers for complex system prototyping, validation, and experiments that require multiple synchronized instruments and high processing capability.