PXIe-5164

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$33,390.00

Item details

Bus Connector: PXI Express
Analog Input Impedance: 1 MOhm, 5 Ohm
Oscilloscope Maximum Bandwidth: 40 MHz
Maximum Sample Rate: 1 GS/s
Analog Input Voltage Range: -5 V to 5 V
Oscilloscope Onboard Memory Size: 1.5 GB
Analog Input Resolution: 14 bits
FPGA: Kintex-7 410T
Number of Voltage Input Channels: 2
CableSense™: No

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NI PXIe-5164 Oscilloscope

PXIe, 40 MHz, 1 GS/s, 14-Bit PXI Oscilloscope

The PXIe‑5164 high-speed oscilloscope has two channels that sample at up to 1 GS/s with flexible settings for coupling, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with fast signals that require up to 40 MHz of analog bandwidth and flexible measurement configurations for up to 25 V. The PXIe‑5164 also features a user-programmable FPGA as well as PXI synchronization and data streaming capabilities.

Part Number(s): 784183-01

Applications and Use Cases of PXIe-5164

The PXIe-5164 High-Speed Digitizer is a high-performance digitizer for PXI Express systems, designed for ultra-high-speed waveform acquisition and high-bandwidth signal analysis. It is ideal for applications requiring fast sampling rates, wide bandwidth, and precise timing performance.

1. Ultra-High-Speed Signal Acquisition
PXIe-5164 captures extremely fast transient and high-frequency signals, enabling detailed analysis of complex and rapidly changing waveforms.

2. Communication & RF Signal Analysis
It is used in advanced communication systems to analyze modulation, signal integrity, and timing behavior in high-speed digital and RF environments.

3. Semiconductor & Mixed-Signal Testing
The module supports testing and validation of ICs, ADC/DACs, and mixed-signal devices through precise waveform capture.

4. Power Electronics & Switching Analysis
PXIe-5164 measures voltage and current waveforms in power systems, allowing detailed analysis of switching characteristics and transient responses.

5. Automated Test Equipment (ATE)
Integrated into high-performance ATE systems, it provides fast and repeatable waveform acquisition for production testing.

6. Research & Advanced Measurement Applications
Widely used in laboratories for high-speed data acquisition, signal characterization, and advanced experimental analysis.

7. Fault Detection & Signal Debugging
Engineers use the module to detect signal distortions, glitches, and timing issues for troubleshooting and system optimization.

Specification

Overview

Brand

National Instruments

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